Biography of William (Bill) Knauer
Bill Knauer has been involved in test and measurement since he
graduated from college in 1972. In recent years he has been
designing parametric test systems, probe cards for parametric test,
low current switch matrixes, and RF probe interfaces.
Below is a list of companies Bill has worked for and the type of
work he has performed. Also listed are the patents Bill is
named as the inventor or co-inventor.
RCA Corporation 1973 to 1978
Semiconductor burn it
Reliability testing of semiconductors
Wafer probing of COSMOS devices
Functional testing of semiconductors
Yield fault analysis and improvement
Solid State Scientific 1978 to 1981
Test equipment maintenance
Probe Card build and maintenance
Test equipment specification and purchase
Low current smoke detector device test
Yield fault analysis and improvement
Technicare Corp. 1981 to 1984
Test Equipment Design for manufacturing medical imaging systems
Solid state photo detector test and yield improvement
CT scanner gantry test
Nuclear Camera photo tube detector test
Digital imaging camera tube test
Keithley Instruments 1984 to 2007
Manufacturing engineering for parametric test systems
Designed first probe card specifically for parametric test in 1988
Published article on designing for low current and low voltage
probing interface in 1989
Designed 1e-13A low current switch matrix in 1992
Project manager S600 parametric tester
Designed 1st 1e-15 Amps per volt probe card
Designed RF interface for Parametric RF testing to 40GHz
Patents
Dual shielded relay reed pack Patent No.
5,559,482
Relay matrix switching assembly Patent No. 5,644,115
Semiconductor probe card for low current measurements Patent No.
5,808,475
High frequency RF interconnect for semiconductor automatic test
equipment Patent No. 6,900,649
Measurement bias tee
Patent No. 7,342,401
Spatial transformer for RF and low current interconnect Patent
No. 7,425,837
SMT low current relay - Patent pending
PCB design for low current testing - Patent pending
Mixing RF and low current on same probe card interconnect - Patent
pending