About Parametric Probe Technology
Parametric Probe Technology was founded in 2008 to advance the technology specifically related to parametric wafer probing.
Parametric Probe Technology concentrates in 3 areas of concern. Coax probe needles for building coax epoxy probe cards, low current test equipment, and consulting services for training personnel in low current parametric probing and project services related to low current testing.
Coax Probe Needles
Blade probe cards have been manufactured for years and used for parametric test because of the ability to manufacture them with very good low current performance. However, blade probe cards do not perform as well as epoxy ring probe cards for mechanical stability and probe card life. Epoxy ring probe cards are leaky and do not perform well at low currents. Vertical probe technologies are very expensive and have some leakage concerns.
Coax probe needles are manufactured by Parametric Probe Technology to utilize the same build techniques as epoxy ring probe cards, but with a coax probe needle specifically designed for low current applications. These probe needles are sold through Advanced Probe Systems. Learn more about these coax probe needles.
Probe Card Low Current Test
Parametric Probe Technology manufactures test equipment specifically for testing low current parametric probe cards. Learn more about this test equipment.
Consulting Services
The founder of Parametric Probe Technology, William (Bill) Knauer, has over 34 years of experience with wafer probing, and, designing and manufacturing test equipment. Over 24 of these years of experience are related to parametric test. He holds several patents related to low current testing, low current wafer probing, and mixing low current and high frequencies on the same test pin.
Bill is available to provide consulting services related to: training of how to make low current measurements, training on low current requirements for parametric probe, designing low current interfaces, designing low current test equipment, and other project requirements related to semiconductor testing and probing. Learn more about these consulting services.